Skip to main contentAll facilities & equipment

EquipmentJEOL JSM IT300LV - Variable Pressure Scanning Electron Microscope (SEM)

Room E104a
University of Canterbury
Mechanical Engineering
Ilam Campus
Christchurch
Canterbury
8041
New Zealand

Description

JEOL JSM IT300 SEM has a LaB6 filament thermal emission electron source installed. Specifications: - LaB6 cathode+ dedicated Ion getter - Resolution 3.0nm@30kV; 15.0nm@1.0kV - E-T Secondary electron detector, 4-quadrant back-scatter detector - Low vacuum option that allows imaging of poorly conductive samples without the need for coating - Oxford X-max 50 EDS detector - Oxford Nordlys EBSD detector - Plasma decontaminator

MORESEE MORE (opens in a new tab)
FEES APPLY|TRAINING AVAILABLE

Contacts

DEPARTMENT

  • Mechanical Engineering

BUILDING

  • Civil and Mechanical Building

AVAILABILITY

  • Available for internal & external use

Location

Room E104a
University of Canterbury
Mechanical Engineering
Ilam Campus
Christchurch
Canterbury
8041
New Zealand