EquipmentCascade Microtech 11000 Probe Station with Temptronic TP03000 thermal chuck

The Cascade Summit 11000 probe station test system, which is integrated with a Keithley semiconductor characteristic analysis system, can be used for high-precision position, different processing temperature, laser processing and small current or voltage detection. This system is mainly for measuring the current-voltage , capacitor-voltage and impedance characteristics of inorganic or organic semiconductor devices, including diode, transistor, and CMOS.

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